Local Voltage Drop in a Single Functionalized Graphene Sheet Characterized by Kelvin Probe Force Microscopy

Citation:

Yan, L. ; Punckt, C. ; Aksay, I. A. ; Mertin, W. ; Bacher, G. Local Voltage Drop in a Single Functionalized Graphene Sheet Characterized by Kelvin Probe Force Microscopy. Nano Letters 2011, 11, 3543-3549.

Date Published:

Sep

ISBN Number:

1530-6984

Accession Number:

WOS:000294790200006

Abstract:

We studied the local voltage drop in functionalized graphene sheets of sub mu m size under external bias conditions by Kelvin probe force microscopy. Using this noninvasive experimental approach, we measured ohmic current-voltage characteristics and an intrinsic conductivity of about 3.7 x 10(5) S/m corresponding to a sheet resistance of 2.7 k Omega/sq under ambient conditions for graphene produced via thermal reduction of graphite oxide. The contact resistivity between functionalized graphene and metal electrode was found. to be <6.3 x 10(-7) Omega cm(2).